J. Edward Swan II

 

Depth Judgment Measures and Occluders in Near-Field Augmented Reality

Gurjot Singh, J. Edward Swan II, J. Adam Jones, Lorraine Lin, and Stephen R. Ellis. Depth Judgment Measures and Occluders in Near-Field Augmented Reality. In Poster Compendium, Proceedings of ACM SIGGRAPH Symposium on Applied Perception in Graphics and Visualization (APGV 2009), pp. 127, September 2009. DOI: 10.1145/1620993.1621021.

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BibTeX

@InProceedings{APGV09-djmoar, 
  author =      {Gurjot Singh and J. Edward {Swan~II} and J. Adam Jones and Lorraine Lin and 
                 Stephen R. Ellis}, 
  title =       {Depth Judgment Measures and Occluders in Near-Field Augmented Reality}, 
  booktitle =   {Poster Compendium, Proceedings of ACM SIGGRAPH Symposium on 
                 Applied Perception in Graphics and Visualization (APGV 2009)}, 
  location =    {Chania, Crete, Greece}, 
  date =        {September 30--October 2}, 
  month =       {September}, 
  year =        2009, 
  pages =       {127}, 
  note =        {DOI: <a target="_blank"
                 href="https://doi.org/10.1145/1620993.1621021">10.1145/1620993.1621021</a>.} 
}